Engineering exchange bias at the interface of self-polarized ultrathin ferroelectric BaTiO<sub>3</sub> and ferromagnetic La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub>
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- doe_osti · checked 2024-11-13
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We investigate the emergence and optimization of conventional exchange bias (EB) in ultrathin (<10 nm) ferroelectric (FE) BaTiO<sub>3</sub> (BTO)/ferromagnetic (FM) La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> (LSMO) epitaxial bilayers without an antiferromagnetic (AFM) material. The EB originates from the electronic orbital reconstruction at the FE-FM interface due to the ferroelectric polarization. We achieve maximum EB of approximately 42 Oe with single-domain polarization in nine-unit-cell-thick BTO, setting the BTO thickness above the critical threshold for ferroelectricity yet below the thickness of strain relaxation and multidomain breakdown. Furthermore, the LSMO layer needs to be thick enough to sustain both the FM layer and polarization-induced AFM spin configuration at the LSMO/BTO interface, yet as thin as possible to enable the EB loop shift. The temperature, training, field, and thickness dependence of the EB confirm that the LSMO/BTO interface exhibits conventional EB despite its unconventional origin. Using x-ray magnetic circular dichroism, scanning transmission electron microscopy, and density-functional-theory calculations, we confirm that the macroscopic EB effect originates from the interfacial AFM spin configuration in LSMO driven by FE-induced d-orbital modifications in interfacial Mn ions. Thus, we engineer strong interfacial EB coupling in artificial multiferroics without a conventional AFM material by controlling FE polarization, highlighting the potential for advanced spintronic applications.. Authors: Maity, Tuhin [Univ. of Cambridge (United Kingdom); Indian Institute of Science Education and Research (India)] (ORCID:0000000343861006); Bansal, Manisha [Indian Institute of Science Education and Research (India)] (ORCID:0000000349440624); Strkalj, Nives [Univ. of Cambridge (United Kingdom); Institute of Physics (Croatia)] (ORCID:0000000182938577); Dolui, Kapildeb [Univ. of Cambridge (United Kingdom)] (ORCID:0000000305760941); Zhang, Di [Purdue Univ., West Lafayette, IN (United States)]. DOE Contract: NA0003525. Subjects: exchange bias; ferromagnets; magnetic thin films; multiferroics; spintronics ferroelectrics; transition metal oxides