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Data for: Subsurface Interface Structure Controlling Local Electronic Properties of Epitaxial Graphene on SiC(0001)

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doe_osti

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Recently realized high-mobility semiconducting epitaxial graphene on silicon carbide, provided an important step towards integration of the graphene-based system into active components in post-silicon micro- and nano-electronics. However, the exact atomic-scale structure and the complex bonding configurations of the first epitaxial graphene carbon layer remain an open problem. Our recent report has shed new light on understanding this interface, where the external transverse electric field-dependent dynamic switching behavior of the Cbuffer-SiC bonds was observed. Here, using scanning tunneling microscopy and spectroscopy (STM and STS), we present the direct evidence of silicon (Si) vacancies at the interface and provide their distribution at the topmost reconstructed SiC(0001) layer. Experimental STM and density functional theory modeling data were used in the preparation of figures in a published article in the Journal of Physical Chemistry Letters. Files related to the figures and supplementary materials in the article are present in this dataset in .txt format.. Authors: Thupakula, Umamahesh (ORCID:0000000305086029); Chen, Shen (ORCID:0000000244058031); Han, Yong; Tringides, Michael (ORCID:0000000150037280); Kolmer, Marek [Iowa State University] (ORCID:0000000267869697). DOE Contract: AC02-07CH11358. Subjects: Condensed matter imaging; Structural properties of condensed matter; Surface properties of condensed matter

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